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Optimizing Low-Current Measurements and Instruments

Authored on: Jan 24, 2011 by Jonathan L. Tucker

Technical Paper

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This paper provides an overview of the tools and techniques involved in obtaining accurate low-current measurements. Topics include hardware selection, potential sources of measurement error, and effective techniques for minimizing these errors. Example applications described include characterization of a field-effect transistor (FET) and a carbon nanotube.
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