datasheets.com EBN.com EDN.com EETimes.com Embedded.com PlanetAnalog.com TechOnline.com  
Events
UBM Tech
UBM Tech
Welcome Guest Log In | Register

Faster Trouble Shooting and Fault Isolation with In-system Diagnostics

Authored on: Nov 4, 2010

Technical Paper

0 0
More InfoLess Info
Troubleshooting and quickly isolating faults is of tremendous value for reducing the time to redesign or repair failing boards. This process can cost a company millions of dollars each year. Supporting OMAP, Sitara, QorIQ, PowerQUICC and PowerPC, this paper describes how using an interpreter that allows the execution of a full test suite for verifying a design or an individual test for fault isolation can dramatically improve quality and reliability with In-System Diagnostics. It describes how memory errors can be isolated to ECC, single-bit, row, column, and correlated to a part's reference designator.


Please disable any pop-up blockers for proper viewing of this paper.

0 comments
write a comment

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page