Faster Trouble Shooting and Fault Isolation with In-system Diagnostics
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Troubleshooting and quickly isolating faults is of tremendous value for reducing the time to redesign or repair failing boards. This process can cost a company millions of dollars each year. Supporting OMAP, Sitara, QorIQ, PowerQUICC and PowerPC, this paper describes how using an interpreter that allows the execution of a full test suite for verifying a design or an individual test for fault isolation can dramatically improve quality and reliability with In-System Diagnostics. It describes how memory errors can be isolated to ECC, single-bit, row, column, and correlated to a part's reference designator.
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