datasheets.com EBN.com EDN.com EETimes.com Embedded.com PlanetAnalog.com TechOnline.com  
Events
UBM Tech
UBM Tech
Welcome Guest Log In | Register | Benefits

Transformation of Connector Test Data for 85 Ohm Differential Impedance Applications

Authored on: Mar 3, 2009 by Jim Nadolny

Technical Paper / Application Note

0 0
More InfoLess Info

The emergence of new high speed data transmission protocols based on non-traditional impedances has come with measurement and simulation challenges. Samtec has addressed some of these new protocols by characterizing non-standard impedance components using standard, 50 Ohm based instruments, calibration standards and familiar calibration techniques.

0 comments
write a comment

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page