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Combining Boundary Scan and JTAG Emulation for advanced structural Test and Diagnostics

Authored on: Jan 7, 2010 by Heiko Ehrenberg and Thomas Wenzel

Technical Paper

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While continuously improving IC and SoC technologies, higher clock rates, and more powerful processors are music to the design engineers' ears, the headaches of test engineers are getting worse and worse. This is hardly surprising. As the ever decreasing test access was the worrying factor in the past, a new problem arose in recent years in the dramatically increasing speed of the signal transmission and the dynamic of associated functions. The resulting failure phenomena and test access limitations have an inevitable impact on the efficiency and practicality of test strategies. This white paper introduces GOEPEL's VarioTAP technology, an extremely flexible and powerful technique for advanced structural tests.

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