datasheets.com EBN.com EDN.com EETimes.com Embedded.com PlanetAnalog.com TechOnline.com  
Events
UBM Tech
UBM Tech
Welcome Guest Log In | Register | Benefits

Integrating Ultra-Fast Waveform Generation and Measurement with Traditional DC I-V and C-V Measurements

Authored on: Apr 7, 2010

Technical Paper

0 0
More InfoLess Info

Characterizing a semiconductor device, material, or process thoroughly requires the ability to make three types of measurements: precision DC I-V measurements, AC impedance measurements, and ultra-fast I-V measurements. Early high-speed I-V test systems were developed for applications like characterizing high-K dielectrics and SOI isothermal testing. When tested using traditional DC I-V techniques, their insulating substrates cause SOI devices to retain heat, skewing their measured characteristics; testing with pulsed signals reduces this effect.

0 comments
write a comment

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page