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Beyond IR Drop: Dynamic Voltage Droops and Total Power Integrity

Authored on: Apr 1, 2008 by Raj Nair and Donald Bennett

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This paper sheds light on key differences such as voltage droops and noise wave propagation resulting from on-chip load interaction with power network impedance. It also discusses how total power integrity may be rigorously inspected through rapid analyses and physics-based simulations with corresponding benefits to system-on-a-chip (SoC) cost and time-to-market.



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