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Active Noise Regulation

Authored on: Jan 18, 2007 by Raj Nair and Donald Bennett

Technical Paper

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The increasing importance of effective power integrity managment for Nanoprocessors and ULSI chips has been well documented. Yield loss and timing problems undetected by traditional verification methods may be traced to a decrease in supply noise margin in components using advanced fabrication processes at and below the 90nm mode. Read this paper to learn more about active noise regulation.

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