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In-situ Sensors for Product Reliability Monitoring

Authored on: Nov 6, 2002 by Satchidananda Mishra and Michael Pecht,Douglas L. Goodman

Technical Paper

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Some advantages of predicting reliability include providing advance warning signs of failure, and the reduction of life cycle costs by reducing inspection and unscheduled maintenance. However, predictions can be inaccurate if they do not account for the actual environments that the product is subjected to in its life cycle. This paper describes an in-situ sensor (prognostic monitor) approach, which can be used to estimate the accumulated damage and the remaining life of semiconductor devices.



For more information on in-situ sensors, visit Ridgetop Group's Web site.

Paper © Ridgetop Group, Inc.
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