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High Volume Automatic Testing of 2.45 GHz Wireless LANs

Authored on: Mar 17, 2003 by Richard L. Abrahams

Technical Paper

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This paper discusses the construction and calibration of a fully shielded RF enclosure which forms part of an automatic test platform for 2.45 GHz PCMCIA Wireless LAN's. This enclosure, together with common RF test equipment and suitable ATE software, provides a complete manufacturing test solution for the high volume testing of the LAN's.

Although the detailed application discussed in this paper is focused on the testing of IEEE 802.11 Direct Sequence (DS) high data rate WLANs, the technology is directly applicable to testing of Bluetooth and other similar applications.

For more information on 802.11, visit Intersil's Web site.



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