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Analog Test Bus Enhances Mixed-Signal Debug and Characterization

Authored on: Mar 11, 2005 by Rick Andlauer and Phuong Vu

Technical Paper

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In today's complex Mixed-Signal and SOC designs, there is a high demand to provide enhanced test capability while using limited pin resources. Testing the various Intellectual Property (IP) blocks has become an important task in verifying that the block is functionally sound and performing to design specifications.



For more information about analog test buses, visit TestEdge's Web site.


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