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Semiconductor IC Test and Design-for-Test Fundamentals

Authored on: Jul 28, 2005 by Al Crouch

Technical Paper

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The purpose of design-for-test (DFT) is to embed the highest performance and most costly electronics into the die to enable the ability to conduct accurate and low-cost quality measurement. DFT, if implemented efficiently, will enable quality to goals to be met within the cost of test budget, and enable vector automation to meeting aggressive time to market and time to volume manufacturing plans. This white paper provides an overview of DFT fundamentals.

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