Comparison of Eye Patterns Generated By Synopsys HSPICE and the Agilent PLTS
In this report we examine passive interconnect in terms of EPs where the EPs are generated using two different methodologies. The first method uses HSPICE from Synopsys, a commercial non-linear time domain simulation tool. The second method uses frequency domain data measured with an Agilent E864B Network Analyzer. This measured data is transformed into the time domain and viewed as an eye pattern using Agilent Physical Layer Test System (PLTS) version 2.5 software. A Samtec Final Inch QPairs QTE-DP/QSE-DP Test and Evaluation Board, with 5mm stack height connectors, is used as the basis for the HSPICE simulations and the network analyzer measurements
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