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A Time-Saving Method for Analyzing Signal Integrity in DDR Memory Buses

Authored on: May 24, 2007 by Min-Jie Chong

Technical Paper / Application Note

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This application note covers new tools and measurement techniques for characterizing and validating signal integrity of DDR (double data rate synchronous dynamic random access memory) signals.

For simplicity, all DDR1, DDR2, DDR3 and other DDR technologies (including the SDRAM side of fully buffered DIMM) are referred to as DDR in this application note, since each of them has similar electrical characteristics.

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