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VSWR Testing of NPTB00050

Authored on: Oct 16, 2008

Technical Paper / Application Note

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This application note describes VSWR stress testing of the NPTB00050 device operated at P3dB and being subjected to 10:1 and 20:1 VSWR conditions.

Previous qualification of Nitronex transistors involved stressing devices with 10:1 VSWR mismatch, however, in order to meet more stringent customer requirements characterization has been extended to a higher mismatch condition of 20:1.

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