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Simulation Fidelity Challenges in Ultra Deep Submicron Integrated Circuits

Authored on: Sep 21, 2007 by Owen Y. Li

Technical Paper / Conference Paper

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This paper serves as a guide for circuit designers, layout designers, and physical verification engineers, to help them develop an understanding of simulation limitations. Challenges arising from shrinking device dimensions, high operating frequencies and mixed-signal design styles are surveyed. Responses to manage risk are discussed.

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